Abstract
A behavioral modeling methodology based on echo state networks for time-domain simulations of the conducted immunity of integrated circuits is proposed. The methodology is applied to a buffered voltage reference integrated circuit that is subjected to dc functional signals with superimposed radio-frequency (RF) interference signals. Behavioral models of three analog subcircuits of the buffered voltage reference are built that capture the RF behavior of the voltages and currents observed in the time-domain simulations of the narrow-band RF interference injection. The behavioral models are interchangeable with the transistor-level subcircuits and they ensure the correct nonlinear impedance toward the connected transistor-level circuits. The conditions for the stability of the resulting top-level circuit with different combinations of behavioral model and transistor-level subcircuits are derived, and the accuracy of the presented behavioral models in the circuit simulator is evaluated.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: IEEE Transactions on Electromagnetic Compatibility
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
