Abstract
Near-field scanning optical microscopy (NSOM) is a scanning probe technique that uses a tapered optical fiber to probe optical characteristics of a surface in registry with topography. Light can either be injected into the sample or collected from the sample via the subwavelength aperture formed at the tip of the probe. While operating in injection mode, variations in the optical power delivered to the probe, and consequently variations in the optical flux through the aperture, place limits on the imaging of spatial variations in optical properties. We present a novel method utilizing bend loss in an optical fiber to correct for variations in the optical flux of the aperture of a NSOM probe.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callSimilar Papers
More From: Review of Scientific Instruments
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
