Abstract
AbstractA diagnosis method for single bridging faults in combinational circuits is proposed. In this method the cause of an error observed at the outputs is analyzed using a diagnosis table constructed based on the circuit and its test patterns. The size of the diagnosis table is proportional to the number of nets the number of tests and much smaller than the fault dictionary.The results of experiments conducted using the test patterns for single stuck‐at faults show that the testing time is nearly proportional to the size of the circuit and that the number of possible fault locations can be reduced to 20 to 30. Hence, it is expected that by conducting fault simulations for those fault possibilities, a maximal resolution can be obtained within a reasonable amount of computation time.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
