Method of detectors offset correction in thermovision camera with uncooled microbolometric focal plane array

Abstract

A microbolometer is an uncooled thermal sensor of infra-red radiation. In thermal imaging, microbolometers organized in arrays called focal plane arrays (FPA) are used. Because of technological process microbolometric FPAs features unwanted detector gain and offset nonuniformity. Because of that, the detector matrix, being exposed to uniform infrared radiation produces nonuniform image with superimposed fixed pattern noise (FPN). To eliminate FPN, nonuniformity correction (NUC) algorithms are used. The offset of detector in array depends from mean temperature of FPA. Every single detector in matrix has its temperature drift, so the characteristic of every detector changes over temperature. To overpass this problem, a temperature stabilization of FPA is commonly used, however temperature stabilization is a relatively power demanding process. In this article a method of offset calculation and correction for every detector in array in function of mean array temperature is described. The method of offset temperature characteristic estimation is shown. The elaborated method let to use unstabilized microbolometric focal plane array in thermographic camera. Method of offset correction was evaluated for amorphous silicon based UL 03 04 1 detector array form ULIS.