Abstract
Many problems in the metrological certification and testing of the parameters of various objects in industry and scientific research call for the detection of systematic variations against a background of random fluctuations. Such problems arise, e.g., in the investigation of slowly varying systematic errors, in the application of repeated measurements to improve the accuracy of measurement results, in the generation of an early-warning signal alerting to the need for repairs on technological equipment before the percentage rejection actually exceeds the allowed level, etc. The problem is complicated by the fact that the results of sequential measurementsare highly correlated in an absolute majority of cases, so that classical trend-detecting methods yield large errors of the first kind.
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