Abstract
A novel method is presented for measuring anisotropic electrical resistivity. In this method, a pedestal structure is fabricated on a surface of a crystal. Such a single sample enables measurement of anisotropic resistivity tensor elements simultaneously. The pedestal structure can be very small, in which case the measurement provides a more precise evaluation of anisotropic resistivity than ever. This method is exclusively advantageous in the case of laminar materials or thin films. An example is given of a measurement of the high-Tc superconductor Bi2Sr2CaCu2O8+δ.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
