Abstract
This work presents a hybrid-recording disk with a single layer CoTbAg recording medium. Co69.48−xTb30.52Agx films with x=0–25.68 at. % are fabricated on glass and naturally oxidized silicon wafer substrate by dc magnetron sputtering. The effects of Ag content on the magnetic properties and the microstructure of the film are investigated. The transmission electron microscope diffraction pattern indicates that all the films are amorphous. The saturation magnetization of the Co67.23Tb30.52Ag2.25 film is about 310 emu/cm3; perpendicular remanence is about 255 emu/cm3, and the perpendicular coercivity is about 3100 Oe at room temperature. The saturation magnetization and perpendicular coercivity decrease rapidly as temperature increases from room temperature to 200 °C. The compensation temperature Tcomp of this film is about 225 °C. This film is a promising candidate for hybrid recording media applications.
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