Abstract
Scanning transmission electron microscopy (STEM), in the mode when incoherently scattered electrons are collected by a high-angle annular dark field (HAADF) detector, is appealing as a technique for probing the 3-dimensional (3D) structural properties of nanoclusters as the image intensity is proportional to both the atomic column height [1] and atomic number (\(Z\)) [2] of the component atoms.KeywordsGenetic AlgorithmMessage Passing InterfaceGenetic OperatorScan Transmission Electron MicroscopyLinear SearchThese keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
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