Metal-semiconductor-metal photodetectors based on single-walled carbon nanotube film–GaAs Schottky contacts

Abstract

We demonstrate the Schottky behavior of single-walled carbon nanotube (CNT) film contacts on GaAs by fabricating and characterizing metal-semiconductor-metal (MSM) photodetectors with CNT film electrodes. We extract the Schottky barrier height of CNT film contacts on GaAs by measuring the dark I-V characteristics as a function of temperature. The results show that at temperatures above ∼260 K, thermionic emission of electrons with a barrier height of ∼0.54 eV is the dominant transport mechanism in CNT film–GaAs junctions, whereas at lower temperatures, tunneling begins to dominate suggested by the weak dependence of current on temperature. Assuming an ideal MS diode, this barrier height corresponds to a CNT film workfunction of ∼4.6 eV, which is in excellent agreement with the previously reported values. Furthermore, we characterize the effect of device geometry on the dark current and find that dark currents of the MSM devices scale rationally with device geometry, such as the device active area, finger width, and finger spacing. Finally, we compare the dark and photocurrent of the CNT film-based MSM photodetectors with standard metal-based MSMs. We find that MSM devices with CNT film electrodes exhibit a higher photocurrent-to-dark current ratio while maintaining a comparable responsivity relative to metal control devices. These results not only provide valuable information about the fundamental properties of the CNT film–GaAs interface but also open up the possibility of integrating CNT films as transparent and conductive Schottky electrodes in conventional semiconductor electronic and optoelectronic devices.