Abstract

Er-doped ZnO (ZnO:Er) thin films were grown by metalorganic chemical vapor deposition. Subsequent annealing improved the crystallinity of the ZnO:Er by suppressing nonradiative centers in the films. The annealed ZnO:Er showed clear 1.54 μm PL originating from the 4I13/2 → 4I15/2 transitions of Er3+ ions. This was in addition to luminescence from the ZnO host. Er-related PL intensity increased when prepared with annealing temperatures of 800–900 °C, while annealing at 1000 °C reduced the intensity. PL of 1.54 μm with high intensity was obtained in the ZnO:Er film that exhibited band-edge emission of free- or bound-excitons.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.