Abstract

Metallic thin films have been evaluated as adhesive layers for first surface mirrors. Thin films (0.5–4 nm thick) of Cr, Cu, Ge, Sn, and Ni, capped with an over layer of 100 nm of Ag have been deposited by means of ion assisted electron beam evaporation onto glass substrates. The specular reflectance, conductivity, morphology, adhesion, and abrasion resistance of the mirrors have been assessed and compared. This work demonstrates the superior Ni and Ge adhesion and abrasion resistance to Ag thin films, while Cr and again Ni are the best candidates in terms of reflectance enhancement. In particular, 4 nm of Ni increases the Ag reflectance from 95.7% to 96.7%, exhibits the strongest adhesion as determined by the cross hatch tape test and the lowest loss of material after the different abrasion tests is just 50% in comparison to 100% for Ag‐coated glass substrates.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call