Abstract

The paper presents the results of obtaining tantalum films with a thickness of 200– 900 nm on titanium using DC magnetron sputtering. As a result, a high-strength “Ti-base – Ta-coating” structure with a hardness of at least 2040±150 HV (20.01±1.47 GPa) was produced. The subsequent modification with high-frequency currents provided an increase in hardness to 3694±443 HV (36.23±4.35 GPa), which was associated with the formation of a thin oxide layer of TaOx with a tantalum concentration of 74.1–75.2 wt.% and oxygen of about 12.5– 13.9 wt.%.

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