Metal content in mosses from the Metropolitan Area of the Toluca Valley: a comparative study between inductively coupled plasma optical emission spectrometry (ICP-OES) and total reflection X-ray fluorescence spectrometry (TXRF)

Abstract

The comparison between inductively coupled plasma optical emission spectrometry (ICP-OES) and total reflection X-ray fluorescence spectrometry (TXRF) for simultaneous determination of metal content (Cr, Cu, Fe, Mn, Pb and Zn) in mosses from the Metropolitan Area of the Toluca Valley was performed. Epiphytic mosses (Fabriona ciliaris and Leskea angustata) were collected in two sampling campaigns and were digested with HNO3, HCl and HF for ICP-OES method and HNO3 and HCl for TXRF method. The certified reference material (IAEA-336, Lichen) and the Standard Reference Material (SRM-1573, tomato leaves) were used for the quality control and to evaluate trueness and precision. Linearity, detection and quantification limits were also determined. Results show an ICP-OES and TXRF trueness mean of 101 ± 5% and 97 ± 9%, respectively; the relative standard deviation (RSD percent) was less than 17% in both methods. The moss samples exhibit a satisfactory precision (RSD ≤ 20%), because the RSD percent for ICP-OES, from 2% to 15%, and that for TXRF, from 1% to 17%, were obtained. One factor experimental design and simple regression analysis (α = 0.05) were used to compare the ICP-OES and TXRF metal concentrations. The statistical results do not show significantly different values for Cu, Mn, Pb and Zn in both the sample campaigns. In addition, the average results for Cr in the first sample campaign (30.3 ± 11.4 mg/kg for ICP-OES and 18.6 ± 9.8 mg/kg for TXRF) and Fe values in the second sample campaign (10,810 ± 2980 mg/kg for ICP-OES and 8380 ± 2350 mg/kg for TXRF) were significantly different in both methods. These differences are attributed to an incomplete sample digestion in the TXRF sample preparation. The results of the simple regression analyses show p-value less than 0.05, which indicates an equivalent and significant relation between ICP-OES and TXRF.