Abstract

Deep brain stimulation electrodes induce massive artifacts on CT images, deteriorating the diagnostic value of examinations. We aimed to investigate the usefulness and potential limitations of a single-energy metal artifact reduction algorithm in head CT performed in patients with implanted deep brain stimulation devices. Thirty-four patients with deep brain stimulation (bilateral, n = 28) who underwent head CT on a 320-detector row scanner and whose images were reconstructed with and without single-energy metal artifact reduction at the examinations were retrospectively included. The severity of artifacts around electrodes was assessed objectively using SDs and an artifact index. Two radiologists subjectively evaluated the severity of artifacts from electrodes, the visibility of electrode localization and surrounding structures, and overall diagnostic confidence on 4-point scales. Background image quality (GM-WM contrast and image noise) was subjectively and objectively assessed. The presence and location of artifacts newly produced by single-energy metal artifact reduction were analyzed. Single-energy metal artifact reduction provided lower objective and subjective metal artifacts and improved visualization of electrode localization and surrounding structures and diagnostic confidence compared with non-single-energy metal artifact reduction images, with statistical significance (all, P < .01). No significant differences were observed in GM-WM contrast and image noise (all, P ≥ .11). The new artifacts from single-energy metal artifact reduction were prominently observed in patients with bilateral deep brain stimulation at high convexity, possibly induced by deep brain stimulation leads placed under the parietal scalp. Single-energy metal artifact reduction substantially reduces the metal artifacts from deep brain stimulation electrodes and improves the visibility of intracranial structures without affecting background image quality. However, non-single-energy metal artifact reduction images should be simultaneously reviewed to accurately assess the entire intracranial area, particularly in patients with bilateral deep brain stimulation.

Highlights

  • BACKGROUND AND PURPOSEDeep brain stimulation electrodes induce massive artifacts on CT images, deteriorating the diagnostic value of examinations

  • The new artifacts from single-energy metal artifact reduction were prominently observed in patients with bilateral deep brain stimulation at high convexity, possibly induced by deep brain stimulation leads placed under the parietal scalp

  • Deep brain stimulation (DBS) electrode implantation has been widely performed as an established surgical procedure for the treatment of various movement disorders such as Parkinson disease, medically intractable essential tremor, and dystonia.[1]

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Summary

Introduction

Deep brain stimulation electrodes induce massive artifacts on CT images, deteriorating the diagnostic value of examinations. We aimed to investigate the usefulness and potential limitations of a single-energy metal artifact reduction algorithm in head CT performed in patients with implanted deep brain stimulation devices. WM contrast (HU) Image noise (HU) CNR. All numeric values are expressed as mean 6 SD, whereas categoric variables are expressed as proportions (percentage). The subjective scores were compared using the Wilcoxon signed rank test. Parentheses show the number of cases for which the subjective score before consensus reading was disputed by both readers. Scale for subjective score: 1 4 undiagnostic, 2 4 suboptimal, 3 4 acceptable, 4 4 fully diagnostic. Scale for subjective score: 1 4 severe, 2 4 moderate, 3 4 mild, 4 4 absent

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