Message from the Technical Program Committee Chairman

Abstract

On behalf of the Technical Program Committee, welcome to the 2005 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium. The RFIC Symposium is a leading edge IEEE technical conference dedicated to the advancement of integrated circuits and sub-systems for RF and communications systems. The RFIC Symposium begins on Sunday, June 12th with workshops and tutorials addressing RF technology, design and simulation, at both system and circuit level. The Plenary Session will be held on Sunday evening, right after the workshops. Two leading experts will share their own views during Sunday evening plenary session: Jerry Neal, Co-founder and Vice President, RF Micro Devices, will talk about “Integration Technologies: Cellular and Beyond”; Ed Healy, Vice President of Silicon Laboratories, will discuss “The Drive for Integration”. The RFIC reception will follow the plenary session to allow for everyone to relax and discuss the industry outlook among friends. The regular technical program begins on Monday featuring invited and submitted technical papers. A pane1 session entitled “CMOS PAS step on the GaAs!” will take place during lunch on Monday and it is posed to allow for many interactive discussions with the audience! Another panel session on Tuesday, “3G Handsets Too Much Power in Your Hands?”, will have panelists from both industry and academia offer their views on the challenges ahead. The interactive forum on Tuesday afternoon also gives attendees a further opportunity to meet one-on-one with authors. In all, the WIC Symposium features 25 technical sessions, an interactive forum, 160 presentations, workshops, panel sessions and tutorials. The interest in RFIC technology, and the venue offered by the Symposium to showcase the latest advancements, continues to grow as evidence by a record number of papers submitted to this year’s conference. The 2005 Technical Program Committee keeps working ditigentl y toward the goal of strengthening the technical quality and breadth of the program, to maintain and improve the legacy left by the previous Symposia. This would not be possible without attracting the professional in the field. We would like to thank all the authors for submitting their work to the RFIC conference: this truly exciting program would not be possible without their efforts! We hope you enjoy the conference.