Message from the ATS 2019 General Co-Chairs

Abstract

Welcome to the IEEE Asian Test Symposium, the twenty-third in a series of annual symposia on testing of integrated circuits and systems that has been held in Asia. The choice of the venue, Hangzhou, is significant as Hangzhou is one of the important tourism cities in China, famous for its natural beauty and historical and cultural heritages. Hangzhou is the capital of Zhejiang province. It is the economic and cultural center of the province as well. Hangzhou began to prosper and flourish in the Tang Dynasty (618-907). It was the capital of the Wu and Yue States in the 10th Century during the Five Dynasties Period, and had its political heyday in the Southern Song Dynasty (1127-1279), when it served as the capital of China. Hangzhou witnessed a commercial boom in the Ming (1368-1644) and Qing (1644-1911) Dynasties, which is continuing at present. We would like to thank the Organizing Committee of ATS 2014 for their diligent hard work in managing all aspects of the symposium. This was truly a coordinated effort stretching across different organizations in China and abroad who worked together to make the symposium a success, while making sure that a variety of issues were addressed in a deliberate and timely manner. Our heartfelt thanks to all our colleagues as well as members of the Steering Committee of ATS 2014. Our sincere thanks also to Zhejiang A&F University for managing different operational aspects of the conference and for help in obtaining the official approval of holding ATS 2014 in Hangzhou, China.