Abstract
Low-temperature transport measurements on superconducting film – normal metal wire – superconducting film (SNS) junctions fabricated on the basis of 6 nm thick superconducting polycrystalline PtSi films are reported. The structures with the normal metal wires of two different lengths L=1.5 and 6 μm and the same widths W=0.3 μm are studied. The zero bias resistance dip is observed for all junctions whereas the subharmonic energy gap structure (SGS) originating from multiple Andreev reflections occurs only in the SNS junctions with short wires.
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