Abstract
Microscopic four-contact probes to inversion layers adjacent to grain-boundaries of semimagnetic HgCdMnTe have been photolithographically patterned. Magnetoresistance measurements performed on these structures revealed aperiodic conductance fluctuations of the magnitude of the order of e 2 h . Analysis of both fluctuation amplitude and their mean period indicated that the studied system was in mesoscopic regime. Additionally, strongly nonlinear current-voltage characteristics were detected in the vicinity of the spin-glass freezing occurring at T = 100 mK.
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