Abstract
Mesoscopic fluctuations were confirmed for the critical current in a p-type InAs-coupled Josephson junction. The critical current was measured as a function of the gate voltage corresponding to the change in the Fermi energy. The critical current showed a mesoscopic fluctuation and its behavior was the same as that of the conductance measured at the same time in both the weak and strong localization regimes. The magnitude and the typical period of the fluctuation are discussed and compared to theoretical predictions.
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