Abstract
A HgCdTe/CdTe system is investigated for use in distributed Bragg reflectors. The modeled performance is described and compared to an as-grown structure. As-grown 15-layer structures with arithmetically varying layer thickness are also annealed at 250°C and performance re-evaluated at 2 h, 7 h, and 24 h annealing times. There is some shifting of the absorption edge and some degradation in reflectivity, but the mirror is still functional.
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