Abstract
Memristive characteristics in semiconductor/metal contacts are studied by conductive atomic force microscopy. The ZnO/Au device shows excellent memristive characteristics under Pt and TiN tips and the resistances of the high-resistance state and the low-resistance state are almost unchanged with time. Unipolar resistive switching behaviour is observed when a positive voltage is applied. In addition, the pure Au film also shows resistive switching behaviour under the TiN tip which was used to test the ZnO/Au device, but this behaviour cannot be observed under a Pt tip. Our results suggest that the memristive characteristics existing in semiconductor/metal contacts are due to the formation of conducting filaments in the interior of the semiconductor and the change in the energy barrier at the interface between the conductive atomic force microscope tip and the ZnO film.
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