Memory effects on piezoelectric InGaAs/GaAs MQW PIN diodes

Abstract

Charge accumulation erects in piezoelectric multiple quantum well (MQW) InGaAs/GaAs PIN diodes grown on (111)B GaAs substrates have been studied regarding memory applications. Strain-induced piezoelectric fields allow new PIN structures with configurations of negative average electric field (NAF) active region. These new devices can store an electric dipole with spatially separated electrons and holes that have low recombination probability and thus long lifetimes. This produces a longrange screening of the field in the active region and hence a strong blue shift of the absorption band edge (maximum light transmission for reading purposes). Both a light pulse and a forward voltage pulse are able to create the dipole (data writing or charged device). The stored dipole can be removed by a reverse electrical pulse (data erasing or device discharge), resulting in a minimum light transmission across the device. Capacitance voltage and time resolved capacitance measurements, after single optical or electrical charging pulse at low temperature (20 K) have been used to determine the stored dipole behaviour. Capacitance transients analysis allowed study of the kinetics of the discharge process, which shows a non-exponential behaviour with storage times up to 10 3 sec, suggesting very long time refresh cycles. Time resolved photocurrent has been used to check read and write capabilities giving on-off ratios up to 30.