Abstract
The memory effect is a type of auto correlation observed in linear systems, which is widely used to control scattered light through thin scattering layers. We show that there exists a strong correlation among the optimized phase distributions of adjacent focal points in focusing through scattering media. The numeric simulation and experiment indicate that within the memory effect, the phase difference between the two adjacent focal points shows an optical phase fringe pattern, and the closer the adjacent focal points are, the wider the fringe pattern will be, corresponding to the tilting of a plane wave phase added onto the acquired optical phase distribution at the focal point. This effect can be utilized for achieving optimal phase distributions of focal point scanning without optical phase evaluation via the experiment, which has great potential application in imaging through the scattering medium.
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