Memory-effect based deconvolution microscopy for super-resolution imaging through scattering media.

Eitan Edrei,Giuliano Scarcelli

doi:10.1038/srep33558

Abstract

High-resolution imaging through turbid media is a fundamental challenge of optical sciences that has attracted a lot of attention in recent years for its wide range of potential applications. Here, we demonstrate that the resolution of imaging systems looking behind a highly scattering medium can be improved below the diffraction-limit. To achieve this, we demonstrate a novel microscopy technique enabled by the optical memory effect that uses a deconvolution image processing and thus it does not require iterative focusing, scanning or phase retrieval procedures. We show that this newly established ability of direct imaging through turbid media provides fundamental and practical advantages such as three-dimensional refocusing and unambiguous object reconstruction.

Highlights

We placed a scattering medium (120-grit ground glass diffuser) so that the recorded image pattern was totally scrambled (Fig. 1c)
We applied a standard deconvolution operation (150 iterations of a Richardson-Lucy (R-L) algorithm30,31) using the PSF of the system measured by replacing the object with an iris of typical size 10–50 μm (Fig. 1d)
DC noise terms will be introduced if objects that are larger than the memory-effect field of view are illuminated, as they will produce uncorrelated patterns within the reconstruction procedure

Summary

Introduction

We placed a scattering medium (120-grit ground glass diffuser) so that the recorded image pattern was totally scrambled (Fig. 1c). We applied a standard deconvolution operation (150 iterations of a Richardson-Lucy (R-L) algorithm30,31) using the PSF of the system measured by replacing the object with an iris of typical size 10–50 μm (Fig. 1d). (a–c) PSF of the imaging system across the memory-effect field of view, measured by laterally shifting an iris in the object plane.

Results

Conclusion