Abstract
The Meissner screening length in Cu of Cu clad Nb and Cu clad NbTi wire was measured over temperature range from T c down to 25 mK. The temperature dependence of the screening length was found to be expressed by ( T + T 0 ) -1/2 from about 1.5 K to the lowest temperature, rather than by T -1/2 derived by Deutscher and de Gennes for the dirty limit. The length becomes 12 µm for Cu clad Nb and 7 µm for Cu clad NbTi wire. Preliminary measurements of field and frequency dependence are also presented.
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