Abstract
A time of flight (TOF) Rutherford backscattering (RBS) system with a nano-probe line has been designed and installed. A medium energy (100–400 keV) nano-probe with beam pulsing and multiscaling detecting techniques was used to obtain enhanced detecting sensitivity for localized analysis. The multiscaling TOF detecting system has about 5 ns time resolution, corresponding to an energy resolution of 2–5 keV, and an advantage over the conventional RBS measurement system in energy resolution. Total charge exposed by TOF–RBS measurement is 4–5 orders of magnitude less than that by conventional RBS using a solid state detector (SSD).
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
