Abstract
The component diffusion coefficients for the Hg0.8Cd0.2Te (MCT) system are measured using radioactive tracers. Multiple branches are observed in the tracer diffusion profiles which are related to fast and slow-diffusing components. Diffusion models for each component are proposed based on the defect chemistry of MCT, a calculation of the thermodynamic factor, and the relationship between component diffusion coefficients and the interdiffusion coefficients for pseudobinary systems. The model provides insight into the thermodynamic properties of the system, the mechanisms for diffusion, and the practical application of tracer diffusion data to interdiffusion and p-to-n conversion by Hg annealing.
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