Abstract
ESR and IR spectroscopy and scanning calorimetry are used to investigate the mechanism of low-temperature radiation telomerization of tetrafluoroethylene (TFE) in hexafluoroisopropanol (HFIP). It is found that the low-temperature telomerization of TFE in HFIP proceeds via an ion-radical mechanism. This process is initiated by the radical anions (CF3)2C·-O− formed during the deprotonation of OH groups of primary hydroxyl radicals (CF3)2C·-OH exhibiting strong acidic properties. An interpretation of ESR spectra of irradiated HFIP recorded at 230–240 K is proposed with regard to the anisotropy on β-fluorine atoms and estimates of the angles between the corresponding C-F bonds and the axis of the unpaired electron orbital.
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