Abstract
Solid-state amorphization process occurring at 600-1060 °C continuous annealing was observed by non-ambient x-ray diffraction on Fe-3%Si-0.5%Cu alloy surface with MgO as thermostable coating. The phenomenon was occurred at α→γ transformation temperatures (920-960 °C) in a layer consisting of Si solid solution in α-Fe and oxides (MgFe)2SiO4, (MgFe)O, SiO2. Amorphous state remained both during heating and cooling to 20 °C. Simulation for diffusion amorphization of Fe (Si) solid solution was proposed. Mg2Si complexes are reduced from oxides by hydrogen then transfer to solid solution and solid-state amorphization is occurred.
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