Mechanism of Photoinduced Phase Segregation in Mixed-Halide Perovskite Microplatelets and Its Application in Micropatterning.

Abstract

Photoinduced phase segregation (PPS) is considered as a dominant factor that greatly deteriorates the performances of mixed-halide perovskite devices. However, the mechanism of PPS is still under fierce debate. Herein, CsPb(Brx/Cl1-x)3 microplatelets (MPs) with homogeneous and heterogeneous surfaces are obtained by controlling the growth conditions. Under continuous irradiation, a new photoluminescence (PL) band at 516 nm gradually appears in the heterogeneous MPs, accompanied with the decreased emission of the mixed phase at 480 nm, revealing the occurrence of PPS, while the photoirradiation only leads to slight PL dimming without PPS in the homogeneous MPs. The direct correlation between PPS and the structural heterogeneity indicates that the localized electric field-induced drift (LEFD) of halide ions/carriers is responsible for the PPS. In situ microfluorescence images evidence that the migration of halide ions is directed by the structural heterogeneity-induced localized electric field. Our refined model not only consolidates that PPS can be suppressed by eliminating the defects but also reveals that PPS can be directed by the distribution of defects. Therefore, a fluorescence micropatterning technique is developed based on PPS.