Abstract
Increased jitter caused by recording marks becoming deformed in an accelerated environmental test was investigated and a model where the change in the speed of crystallization is affected by passive oxidation on the amorphous surface of the recording layer was devised. The model clarified the mechanism by which deformation in the marks caused increased jitter in the accelerated environmental test. Adding nitrogen into the gas when sputtering the protective layer adjacent to the recording film was investigated. It was confirmed that a prototype disk with this protective layer has decreased jitter after a 500 h accelerated test and superior power margins.
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