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Abstract
The effects of O2 inductively coupled plasma (ICP) treatment on the chemical composition and work function of indium-tin-oxide (ITO) surface were investigated. Synchrotron radiation photoemission spectroscopy showed that the O2 ICP treatment resulted in the increase of the ITO work function by 0.8 eV. Incorporation of oxygen atoms near the ITO surface during the ICP treatment induced a peroxidic ITO surface, increasing the work function. The enhanced oxidation of a thin Ni overlayer on the O2-ICP-treated sample suggests that preventing the migration of oxygen atoms into the active region of organic light-emitting diodes is important for improving device lifetime.
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