Mechanical properties of H2Pc self-assembled monolayers at the single molecule level by noncontact atomic force microscopy

Abstract

The mechanical properties of molecular self-assembled monolayers (SAMs) play an important role in understanding the interactions between molecules in the self-assembly, the interactions between molecules and substrate, and thus the formation mechanism of SAMs. Using a high-resolution noncontact atomic force microscope (NC-AFM) combined with a scanning tunneling microscope (STM), we have successfully obtained the sub-molecular resolution of a H2Pc self-assembled monolayer grown on a Pb(111) surface. A 2 × 2 superstructure was observed in both AFM and STM topographic images. The lateral critical force of removing a H2Pcmolecule from its SAM and moving a single H2Pc molecule on Pb(111) were measured. An oscillation of the critical force along the edge of the H2Pc SAM with a period of two molecular sites was observed, which can be attributed to the 2 × 2 superstructure. The lateral critical force caused by intermolecular interaction was found to be 25 pN on average and is typically two times larger than the molecule–substrate interaction.