Abstract
The influence of Ar+ ion irradiation on structural and nanomechanical properties of Yttria Stabilized Zirconia (YSZ) single crystals were studied. Specimens grown in three crystallographic orientations 〈1 0 0〉, 〈1 0 0〉 and 〈1 1 1〉 were irradiated at room temperature with 160 keV Ar-ions up to 3 fluences: 1 × 1014, 1 × 1015 and 1 × 1016 cm−2. Structural properties of the modified layers were measured by means of Grazing Incidence X-ray Diffraction (GI XRD) and Raman Spectroscopy techniques, whereas nanomechanical properties were asessed by using nanoindentation technique. Obtained results revealed shifts of the characteristic peaks and hardening effect in the function of Ar-ion fluence. Reported changes originate from at least two phenomena: (i) creation of radiation defects and (ii) local increase of stress induced by damage created by incoming ions – which magnitude may depend on crystallographic orientation.
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