Abstract
The acoustic microscope is particularly interesting for analysis and micro-characterisation. Its principle is based on the use of a convergent beam of ultrasonic waves at very high frequencies. The purpose of this work is to apply non-destructive techniques of ultrasonic scanning microscopy between 50 and 600 MHz. These techniques are suitable for the depth imaging of a single-layer sample system (chromium on steel substrate), and to evaluate the local elastic properties with a resolution of the order of micrometers. (© 2004 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)
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