Measuring the normalized jones matrix of anisotropic samples by means of static ellipsometry

Abstract

Functional capabilities of the static photometric scheme of ellipsometric measurements proposed earlier are considered as applied to anisotropic reflecting objects. Combination of different positions of the optical elements, as well as addition of two new positions of the polarizer (P = 0° and 90°) to those used before (P = ±45°) made it possible to obtain 24 equations for determination of the normalized Jones matrix of an anisotropic sample. For the ideal compensator (ρ C = i), this system breaks down to 12 pairs of mutually identical equations. However, in this case, all three elements of the Jones matrix can be determined provided that ρ pp ≠ ρ ps ρ sp . Computer simulation of the Jones matrix measurement indicates high accuracy of determination of the elements ρ pp and ρ ps and much lower accuracy for determination of ρ sp .