Measuring the alignment of low-angle boundaries formed during deformation

Abstract

The determination of the alignments of low-angle boundaries by transmission electron microscopy and electron backscattering diffraction (EBSD) methods is discussed. Two methods of automatically determining boundary alignments from EBSD maps, the marching Radon transform and triple junction analysis methods, are compared and shown to produce comparable results. Measurements of Al–0.1 Mg deformed both at room temperature and elevated temperatures confirm that the alignment of low-angle boundaries is primarily a function of the deformation mode, rather than the crystallography.