Abstract
AbstractThis chapter focuses on the two experimental techniques—the surface force apparatus (SFA) and the atomic force microscope (AFM)—that are commonly used for measuring molecular level forces that act between two surfaces at small separation distances. The first part of this chapter covers the fundamental principles of SFA and AFM design. The second half of this chapter illustrates the application of AFM to measuring surface forces with examples the measurement of van der Waals forces, atomic level repulsive forces, frictional forces, electrostatic double-layer forces, and meniscus forces from liquid films and from capillary condensation.
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