Abstract
A method is presented of in situ measurements of stacking fault densities in shockedface-centred-cubic (FCC) crystals using x-ray diffraction. Using results from both thesecond and fourth diffraction orders, wherein shifts in the Bragg peaks due to faulting areaccounted for, we calculated fault densities present in a molecular dynamics (MD)simulation of shocked single crystal of copper. The results are in good quantitativeagreement with dislocation density measurements inferred directly from the MDsimulation. The x-ray diffraction method thus presents a real possibility for experimentaldetermination in real time of dislocation densities in crystals during shock wave passage.
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