Abstract
This article outlines the difficulties associated with measuring quantum yields for solid-state samples using a high-pressure mercury arc lamp as the irradiation source. Details are given for the conversion of an inexpensive frequency-doubled neodymium-doped yttrium aluminum garnet (Nd:YAG) diode laser pointer module into a viable irradiation source. The modified Nd:YAG laser was incorporated into a computer-controlled system, which allowed for the simultaneous irradiation and spectroscopic monitoring of the sample. The data obtained with the Nd:YAG diode laser system show far less scatter than data obtained with a high-pressure Hg arc lamp, and consequently the degradation rates obtained with the laser system could be calculated with far greater accuracy.
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