Abstract
ABSTRACTImage contrast for the examination of multiphase polymers in the transmission electron microscope (TEM) usually requires differential staining by a heavy element (Os, Ru, U). Staining methods have provided a wealth of microstructural information in polymers, but there are situations, particularly where high resolution is needed, where staining is undesirable or impossible. This research has collected microstructural information from multiphase polymers without heavy-element stains using spatially-resolved electron energy-loss spectroscopy (EELS) in a scanning transmission electron microscope (STEM). The technique is known as spectrum imaging. The principal problems facing spectrum imaging in polymer applications are: (1) the identification of spectral fingerprints distinguishing different polymer phases; and (2) the extraction of meaningful microstructural data from large data sets where the signal is weak due to instrumentation and materials constraints. This paper describes applications of spectrum imaging to PE/PS and HDPE/Nylon 6 blends. The aim is to identify adequate spectral features and establish data acquisition and extraction procedures for applications to general, unstained, multiphase polymers.
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