Measuring on-chip waveguide losses using a single, two-point coupled microring resonator.

Abstract

We demonstrate a method for measuring on-chip waveguide losses using a single microring resonator with a tunable coupler. By tuning the power coupling to the microring and measuring the microring's through-port transmission at each power coupling, one can separate the waveguide propagation loss and the effects of the coupling to the microring. This method is tolerant of fiber-chip coupling/alignment errors and does not require the use of expensive instruments for phase response measurements. In addition, this method offers a compact solution for measuring waveguide propagation losses, only using a single microring (230 µm×190 µm, including the metal pads). We demonstrate this method by measuring the propagation losses of silicon-on-insulator rib waveguides, yielding propagation losses of 3.1-1.3 dB/cm for core widths varying from 400-600 nm.