Measuring Multiresolution Surface Roughness Using V-System

Abstract

Surface roughness is a land-surface parameter that is widely used in terrain analysis. Some typical roughness details, which have important effects on surface analysis, fail to be characterized on previous roughness maps. The objective of this paper is to provide a more accurate small-to-large scale roughness overview. The new roughness method is designed based on a complete orthogonal system called the V-system. The V-system roughness utilizes the special functions to detect and extract the roughness characteristics from high-resolution digital elevation models (DEMs). In this paper, Lunar Orbiter Laser Altimeter-derived DEMs are used as the source data for the roughness calculation. Compared with the global root-mean-square slope and Fourier-based roughness maps, the V-system roughness maps show that more typical roughness details have been added to clearly indicate the small roughness variations on the large map. Furthermore, the reliability and practicability of V-system roughness are demonstrated based on the multiresolution DEMs. As an example, the statistical parameters of the roughness characteristics in the lunar Maria and highlands identify the fact that the highlands are rougher at all scales than the Maria. And this difference corresponds to the basic roughness property.