Abstract
A semiautomatic method is described for measuring, fast and accurately, the mode propagation losses of planar or channel waveguides for integrated optical circuits. It involves a video camera aided by a microcomputer, and the real-time measurement is feasible over a broad range from low loss (<1 dB/cm) to high loss (of the order of 102 dB/cm). We examined the propagation properties of several optical waveguides prepared by sputtering or ion migration.
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