Abstract
AbstractAlthough there are many methods to evaluate metal surface roughness, it is difficult to detect the substrate roughness of coated samples. Depth profile analysis (DPA) is proposed as a new method for the substrate roughness measurement, and glow discharge optical emission spectrometry (GDOES) becomes a candidate in substrate roughness measuring instruments. With this method, the typical roughness parameters Ra (arithmetic mean of the absolute deviation values of the roughness profile) and Ry (maximum value of consecutive peak and valley heights of the roughness profile along the sampling length) can be easily obtained. The principle of this method is discussed and the formulasof the principle are deducted in this paper. Electrodeposited zinc coating on copper substrate specimens is used as an example to explain the measuring process. Copyright © 2007 John Wiley & Sons, Ltd.
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