Measuring distribution of the ellipsoid of birefringence through the thickness of optical disk substrates

Abstract

We have measured the birefringence of polycarbonate optical disk substrates, using ellipsometry. For a more comprehensive characterization, the probe beam was incident upon substrates in a wide range of polar angles and from different azimuths relative to track direction (ø). Our measurements show that the ellipsoid of birefringence is tilted in the plane of radial (r) and normal (z) directions. The tilt angle varies through thickness, with a maximum value of approximately 10°. For beams passing through the substrate in the ø-z plane and at large incident angles, this tilt causes significant conversion (up to 100%) between p- and s-polarized components. Distributions of other parameters, such as the values of in-plane and vertical birefringence, are obtained simultaneously in the measurements.