Abstract

Compound defect is the common damage of equipment. However, measuring compound defect is difficult because of the complex correlation between multiple single-point defects. Fortunately, as the third generation of neural network that is closest to biological intelligence, the spiking neural network (SNN) has a huge potential on building classifiers. Moreover, time-frequency processing technologies for raw signals are often independent of the training of neural network, so that the end-to-end mode is not able to be built. Therefore, this paper tries to combine the wavelet packet transform (WPT) with SNN, and proposes a wavelet gradient integrated spiking neural network (WGI-SNN) framework. First, a wavelet gradient propagation mechanism (WGPM) is deduced, then recursive down-sampling wavelet networks (DSWNs) is designed to simulate the WPT. Secondly, a SNN model integrating DSWNs is constructed to measure compound defect samples. In addition, an experiment is implemented to verify the effectiveness and practicability of the proposed method.

Full Text
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