Measuring carrier injection from amorphous silicon into crystalline silicon using photoluminescence

Abstract

AbstractIn devices with intrinsic amorphous silicon layer on a crystalline silicon substrate, the light absorbed in the amorphous layer can be weakly electronically coupled into the silicon base. Such carrier injection has previously been reported from measurements on finished devices containing stacks of intrinsic and doped amorphous silicon layers. Here, we use spectral response of photoluminescence, a contactless approach, to investigate this carrier injection on significantly simpler structures. In such devices, the effect of absorption in the front layer can be measured by the internal quantum efficiency. A highly absorbing front layer is expected to cause a drop in the quantum efficiency at short wavelengths. However, if electron‐hole pairs that are generated in the front layer are subsequently injected into the base, the optical losses will be reduced, resulting in a partial recovery of the quantum efficiency at short wavelengths. Here, we quantify the efficiency of carrier injection from the intrinsic amorphous silicon front layer to the crystalline silicon base, by measuring the spectral response of photoluminescence heterojunction test structures. For devices with just an intrinsic amorphous silicon layer, the carrier injection from the layer was found to be close to unity.