Abstract
Using electrostatic self-assembly of a [CuPc(COOH)4]/polydiallyldimethylammonium chloride (PDDA) film, we demonstrate that signal fluctuation induced by a random surface inhomogeneity of less than 70 nm can be approximately resolved by a nonlinear-imaging technique with a phase object (NIT-PO) as opposed to Z-scan. In our NIT-PO simulation the sample is regarded as perfectly parallel, while the incident intensity distribution is modified to mimic that of an extremely weak laser beam traversing the sample, which is detected by a charge-coupled-device (CCD) camera. However, the original phase in the simulations is maintained, since phase distortions caused by the sample are not measurable at the CCD plane.
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