Abstract
We present measurements of the hemispherical distribution function of the mean intensity scattered by randomly rough isotropic dielectric surfaces. The surface profiles, etched on photoresist, constitute a good approximation to Gaussian random processes with Gaussian correlation functions. The experimental situation approximates the case in which the light is scattered by the rough interface between air and a semi-infinite dielectric medium, illuminated from the air side. The results show features that can be attributed to multiple scattering. For the rougher sample, a well-defined enhanced backscattering peak is observed in both, the co- and cross-polarized scattering measurements.
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